Han, Haneul and Lee, Chaerin and Kim, Youjung and Lee, Jinhyun and Yoon, Sanghwa and Yoo, Bongyoung (2022) The self-annealing phenomenon of electrodeposited nano-twin copper with high defect density. Frontiers in Chemistry, 10. ISSN 2296-2646
pubmed-zip/versions/2/package-entries/fchem-10-1056596-r1/fchem-10-1056596.pdf - Published Version
Download (2MB)
Abstract
Electroplated copper was prepared under typical conditions and a high defect density to study the effect of the defects on its self-annealing phenomenon. Two conditions, grain growth and stress relaxation during self-annealing, were analyzed with electron backscattered diffraction and a high-resolution X-ray diffractometer. Abnormal grain growth was observed in both conditions; however, the grown crystal orientation differed. The direction and relative rate at which abnormal grain growth proceeds were specified through textured orientation, and the self-annealing mechanism was studied by observing the residual stress changes over time in the films using the sin2Ψ method.
Item Type: | Article |
---|---|
Subjects: | STM Library > Chemical Science |
Depositing User: | Managing Editor |
Date Deposited: | 25 Jan 2023 05:30 |
Last Modified: | 12 Mar 2024 04:08 |
URI: | http://open.journal4submit.com/id/eprint/950 |